Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar⁺ ion beam: a comparative study

• Indra Sulania,
• Harpreet Sondhi,
• Tanuj Kumar,
• Sunil Ojha,
• G R Umapathy,
• Ambuj Mishra,
• Ambuj Tripathi,
• Richa Krishna,
• Devesh Kumar Avasthi and
• Yogendra Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 367–375, doi:10.3762/bjnano.15.33

• samples were studied via AFM for the surface topography and change in root-mean-square (RMS) surface roughness. Figure 1 shows AFM images of pristine and 100 keV Ar+ ion-irradiated Si samples. Pristine samples show a smooth surface with a surface roughness of ≈0.5 nm as observed in Figure 1A (a). Figure

•  1A (b–e) shows the surface topography of the irradiated samples at respective ion fluences of (b) 3 × 1017, (c) 5 × 1017, (d) 7 × 1017, and (e) 9 × 1017 ions/cm2. The surface roughness (Rq) is found to be increased with ion fluence from ≈1.0 nm to 1.6 nm due to ion-induced sputtering at a 60

Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• surface topography [7]. A sharper needle tip leads to more accurate measurements [8]. During the scanning process, tip and sample come into mutual contact, causing wear on the tip [9]. Tip wear or damage in practical applications can have severe consequences, including reduced image quality and erroneous

• , and S represents the accurate surface topography of the sample. An accurate reflection of the tip morphology information is possible when the sample surface S exhibits sharp and rapidly changing morphology features. A blind modeling algorithm utilizes the topography information of each pixel and its

• surface changes, altering the measured surface roughness. A decrease in Ra indicates changes of the tip shape due to wear, leading to a decrease in image quality. Conversely, a constant Ra implies minimal tip wear and a more accurate representation of the sample surface topography. By comparing the

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• simulate a surface topography with a known disturbance signal, while the feedback controller drove the second piezo to compensate for the disturbance and apply the ORT actuation signal as shown in Figure 3B. We selected a 30 Hz triangular waveform (Figure 3C) as the disturbance. Such a triangular

Spatial variations of conductivity of self-assembled monolayers of dodecanethiol on Au/mica and Au/Si substrates

• Julian Skolaut,
• Jędrzej Tepper,
• Federica Galli,
• Wulf Wulfhekel and
• Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2023, 14, 1169–1177, doi:10.3762/bjnano.14.97

• applied method uses conductive atomic force microscopy (CAFM). In this technique, a conductive probe is used in an AFM, which allows for imaging the surface topography (and other characteristics such as adhesion and stiffness) with lateral resolution while simultaneously being able to measure current

• the surface topography, the conductance obtained from averaging over random points on the surface [12][21][22][23][24] is prone to incorrect averaging. The lateral variation of the conductive properties limits strongly the amount of lateral probe positions over which measurements of such

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• ) to the first and second modes, respectively), maps of surface topography, transverse stiffness, and transverse elastic modulus across the fiber were obtained. Typical (setpoint/free air) amplitudes for the first mode were ca. 25/50 nm. Second mode amplitudes (always held constant, in and out of

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• the measurement. (a) Surface topography and (b) CPD image of the pn-patterned Si surface. The CPD image was obtained by KPFM using an AC bias voltage with a low modulation frequency of fm = 100 Hz. The scan size was 7 μm × 2.1 μm. (c) Line profile corresponding to the white line in panel (a); (d) line

Growing up in a rough world: scaling of frictional adhesion and morphology of the Tokay gecko (Gekko gecko)

• Anthony J. Cobos and
• Timothy E. Higham

Beilstein J. Nanotechnol. 2022, 13, 1292–1302, doi:10.3762/bjnano.13.107

• , performance, and 3D surface topography, revealed key aspects of scaling that have significant impacts on our understanding of gecko adhesion. Setal diameter and density did not change with body size, whereas toepad area, and setal length, and therefore setal aspect ratio, increased with body size. Frictional

• . Surfaces Our experiments were carried out using a series of artificial surfaces that varied in surface topography and asperity size. In considering both the appropriate length-scale of animal adhesive structures and relevant manufactured artificial surfaces, we chose 7 different sandpapers that encompassed

Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders

• Sebastian Lifka,
• Kristóf Harsányi,
• Erich Baumgartner,
• Lukas Pichler,
• Dariya Baiko,
• Karsten Wasmuth,
• Johannes Heitz,
• Marco Meyer,
• Anna-Christin Joel,
• Jörn Bonse and
• Werner Baumgartner

Beilstein J. Nanotechnol. 2022, 13, 1268–1283, doi:10.3762/bjnano.13.105

• deflect the fiber in order to obtain the interaction energy, but not all to the bottom of the sinusoidal surface topography. Thus, a clear total energy minimum exists. Finally, in state C, bending requires less energy than can be gained by the van der Waals interaction. Thus, the fiber adapts completely

• scale bars of 0.8 mm length. Data is presented in Table S1 of Supporting Information File 1. Principle geometry of the interaction of a nanofiber with a periodic sinusoidal surface topography (a) and as single length unit when cut free (b). The periodic surface structure is drawn in black, the fiber is

• ) Photography of a laser-structured titanium alloy sample after ultrafast laser processing. The colorful appearance arises from optical diffraction of the ambient natural light at the grating-like LIPSS-covered surface topography (structural colors). (b) Scanning electron micrograph of the LIPSS-covered

Roll-to-roll fabrication of superhydrophobic pads covered with nanofur for the efficient clean-up of oil spills

• Patrick Weiser,
• Robin Kietz,
• Marc Schneider,
• Matthias Worgull and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2022, 13, 1228–1239, doi:10.3762/bjnano.13.102

• of 53–75 µm. This procedure results in a surface topography of craters and edges with finer spikes on top. This sandblasted roller is mounted in a two-roller calender (Figure 2b) and heated (Figure 2c). Best quality nanofur in terms of high contact angles is obtained if the temperature is set

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• , force volume mapping, surface topography limitations, or positioning of the tip with respect to double layer overlap, it is clear that the purely electrical modes offer significant performance enhancement over mechanically coupled modes. When implementation of KPFM at z ≤ R becomes feasible, the

Bioselectivity of silk protein-based materials and their bio-inspired applications

• Hendrik Bargel,
• Vanessa T. Trossmann,
• Christoph Sommer and
• Thomas Scheibel

Beilstein J. Nanotechnol. 2022, 13, 902–921, doi:10.3762/bjnano.13.81

• distinguished according to their basic defense mechanism. These are (A) surface topography, which disturbs and inhibits the initial adhesion based on morphological features, (B) material modification, where intrinsic chemical and physical properties result in microbe-repellence, and (C) additives and coatings

Effects of substrate stiffness on the viscoelasticity and migration of prostate cancer cells examined by atomic force microscopy

• Xiaoqiong Tang,
• Yan Zhang,
• Jiangbing Mao,
• Yuhua Wang,
• Zhenghong Zhang,
• Zhengchao Wang and
• Hongqin Yang

Beilstein J. Nanotechnol. 2022, 13, 560–569, doi:10.3762/bjnano.13.47

• , Figure S3c,d. Cell surface roughness is a quantitative measurement of the variability of cellular surface topography and serves as an indicator to assess the state of the cell (i.e., the greater the roughness, the greater the undulation of the cell surface topography [27]). It can be involved in many

• with 2 mL of PBS. Then, the cells were observed in QI working mode with Setpoint 1 nN, Z length of 2000 nm, and pixel time of 50 ms. The topography scanning at each pixel position (128 × 128) of the selected area (50 μm × 50 μm) was done to obtain high-resolution surface topography features of cells

Micro- and nanotechnology in biomedical engineering for cartilage tissue regeneration in osteoarthritis

• Zahra Nabizadeh,
• Mahmoud Nasrollahzadeh,
• Hamed Daemi,
• Mohamadreza Baghaban Eslaminejad,
• Ali Akbar Shabani,
• Mehdi Dadashpour,
• Majid Mirmohammadkhani and
• Davood Nasrabadi

Beilstein J. Nanotechnol. 2022, 13, 363–389, doi:10.3762/bjnano.13.31

Selected properties of Al_xZn_yO thin films prepared by reactive pulsed magnetron sputtering using a two-element Zn/Al target

• Witold Posadowski,
• Artur Wiatrowski,
• Jarosław Domaradzki and
• Michał Mazur

Beilstein J. Nanotechnol. 2022, 13, 344–354, doi:10.3762/bjnano.13.29

• a function of the distance from the target axis on both sides (front and back) of the substrate. The lowest measured resistivity was about 4 × 10−3 Ω·cm. Additionally, optical properties, surface topography, and elemental composition were determined in selected areas of the substrate. Keywords

The effect of metal surface nanomorphology on the output performance of a TENG

• Yiru Wang,
• Xin Zhao,
• Yang Liu and
• Wenjun Zhou

Beilstein J. Nanotechnol. 2022, 13, 298–312, doi:10.3762/bjnano.13.25

• full contact with PTFE, but the small nanoparticles have no or not full contact with PTFE, which leads to the difference in output efficiency. The effect of surface topography on the output performance was studied by classifying the nanocrystals according to different shapes. The reason for the

Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)

• Carl Drechsel,
• Philipp D’Astolfo,
• Jung-Ching Liu,
• Thilo Glatzel,
• Rémy Pawlak and
• Ernst Meyer

Beilstein J. Nanotechnol. 2022, 13, 1–9, doi:10.3762/bjnano.13.1

• metal surface, as observed on different noble metals [45][46]. Figure 1b and Figure 1c show STM topographic images after such process. While the surface topography remains unchanged in comparison to Figure 1a, numerous scan instabilities are now present, which we attribute to CO molecules diffusing

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• the approach curve; it is independent of surface topography and can be done prior to starting the actual scan. We used different types of cantilevers with a force constant in the range of 0.5–50 N/m and resonant frequencies of 40–400 kHz. Some of the probes had sharp custom-made spikes grown according

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• was measured by TEM for different grains (see Supporting Information File 1). Both the TEM image and the FSD image, the latter is recorded with the EBSD detector and highlights the surface topography, show the different milling depths for different grains. Faster milling grains were milled to a 226 nm

• maps were recorded and evaluated. The measurements and evaluations are shown in Figure 7a–c. The figure insets show the experiments with the lowest ion dose. The 0° incidence angle milling creates a strong surface topography in both cases, as evidenced in the forward scatter diffraction image (Figure

•  7a). Figure 7a shows an overlay of the FSD image with the phase map. A strong surface topography was expected as different grain orientations mill at different rates. As a result of the induced strong topography, a lot of the regions cannot be indexed, returning twice the amount of zero solutions for

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• piezoelectricity has been patterned into multilayered MoTe2 [56]. In the case of helium ion irradiation of a bulk van der Waals layered ferroelectric semiconductor crystal (CuInP2S6), local volume expansion due to helium ion implantation was observed, forming a conical surface topography within which for

Structural and optical characteristics determined by the sputtering deposition conditions of oxide thin films

• Petronela Prepelita,
• Florin Garoi and
• Valentin Craciun

Beilstein J. Nanotechnol. 2021, 12, 354–365, doi:10.3762/bjnano.12.29

• diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), while the surface topography of the samples was analyzed using scanning electron microscopy (SEM). The optical characteristics were measured for samples with the same composition but obtained with different deposition parameters, such as increasing

Imaging of SARS-CoV-2 infected Vero E6 cells by helium ion microscopy

• Natalie Frese,
• Patrick Schmerer,
• Martin Wortmann,
• Matthias Schürmann,
• Matthias König,
• Michael Westphal,
• Friedemann Weber,
• Holger Sudhoff and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 172–179, doi:10.3762/bjnano.12.13

• allowed imaging of Figure 2c3 without any external charge compensation. From the quality of this image, it can be inferred that the deposited carbon layer rendered the sample sufficiently conductive. However, small structures are still visible on the membrane surface, which may originate from surface

• topography or material contrast. The deposited carbon film is presumably thinner than typical conductive metal or carbon coatings for SEM imaging, and it does not show any surface masking and clustering as seen on the gold substrate in the upper left of Figure 2b2. The energy of the incident hydrocarbons is

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• , an electrical back contact is created between the microscope chuck and the sample. Results and Discussion The vertical PIN structure Figure 2 shows the surface topography of the cross section of the PIN diode. The different materials used (silicon substrate, epitaxial layers, oxides, and alloy metals

Helium ion microscope – secondary ion mass spectrometry for geological materials

• Matthew R. Ball,
• Richard J. M. Taylor,
• Joshua F. Einsle,
• Fouzia Khanom,
• Christelle Guillermier and
• Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

• substitute in the crystal lattice within a solid solution. The Li signal appears to be stronger along mica sheets perpendicular to the c-axis of the crystal structure. However, this may be the result of surface topography similar to that observed in the zircon samples, as a result of polishing picking out

High permittivity, breakdown strength, and energy storage density of polythiophene-encapsulated BaTiO₃ nanoparticles

• Adnanullah Khan,
• Amir Habib and
• Adeel Afzal

Beilstein J. Nanotechnol. 2020, 11, 1190–1197, doi:10.3762/bjnano.11.103

• the SEM image shown in Figure 4a. PTh, on the other hand, exhibits an inhomogeneous surface morphology with large flakes of polymer randomly distributed on the surface. In case of core–shell BTO-PTh nanoparticles (Figure 5b), the surface topography is very consistent with uniformly distributed sub

• images of the as-prepared BTO nanoparticles (a), BTO-PTh nanoparticles (b), and pristine PTh (c). 3D images showing the surface topography, and 2D images along with surface profiles showing the surface morphology of all samples. Dielectric properties of the as-prepared BTO nanoparticles, pristine PTh

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

• Christian Ritz,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

• results in a continuous measurement of the local surface potential, the capacitance gradient, and the frequency shift induced by surface topography. In contrast to conventional techniques, the detection of the topography-induced frequency shift enables the compensation of all electrostatic influences

• FM-AFM can be separated into a component induced by surface topography, Δftopo, and a component induced electrically, Δfel, therefore The coefficient a is proportional to the capacitance gradient C′′ and has the unit of Hz V−2. It is one of the three sample properties that are continuously estimated

• surface topography is shown in Figure 3a, the obtained frequency shift is shown in Figure 3e. During postprocessing, the recorded Δf signal and bias voltage are fed to the TD-KFM controller. From the hidden contributions at fm and 2fm, the state observer reconstructed the sample properties, which are